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Call for Papers

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The IEEE European Test Symposium (ETS) is Europe’s premier forum dedicated to presenting and discussing scientific results, emerging ideas, applications, hot topics and new trends in the area of electronic-based circuits and system testing. In 2014, ETS will take place in the Heinz Nixdorf Forum in Paderborn. It is organized by the University of Paderborn, which co-sponsors the event jointly with the IEEE Council on Electronic Design Automation (CEDA) and the Test Technology Technical Council (TTTC). ETS also features a special track on Emerging Test Strategies (ETS2), where new problems and ideas can be discussed in an informal atmosphere. A Test Spring School will be organized in conjunction with ETS’14.

You are invited to participate and submit your contributions to ETS’14. The areas of interest include (but are not limited to) the following topics:

  • Analog Test
  • ATE Hardware and Software
  • Automatic Test Generation
  • Board Test and Diagnosis
  • Boundary Scan Test
  • Built-In Self-Test (BIST)
  • Current-Based Test
  • Defect-Based Test
  • Delay and Performance Test
  • Dependability and Functional Safety
  • Design for Test (DFT)
  • Design Verification and Validation
  • Diagnosis and Silicon Debug
  • Economics of Test
  • Failure Analysis
  • Fault Modeling and Simulation
  • Fault Tolerance
  • High-Speed I/0 Test
  • Low-Power IC Test
  • Memory Test and Repair
  • MEMS Test
  • Microprocessor Test
  • Mixed-Signal Test
  • Nanotechnology Test
  • On-line Test
  • Power Issues in Test
  • Reliability
  • RF Test
  • Security Issues in Test
  • Self-Repair
  • Signal Integrity Test
  • Stacked or 3D ICs Test
  • Standards in Test
  • System Test
  • SiP and SoC Test
  • Test Synthesis
  • Test of Reconfigurable Systems
  • Test Quality
  • Thermal Issues in Test
  • Transient and Soft Errors
  • Yield Analysis and Enhancement


ETS’14 will produce Formal Proceedings of scientific papers. The best contributions will be selected for submission to regular issues of the Journal of Electronic Testing: Theory and Applications (JETTA), published by Springer and IEEE Design & Test of Computers. The Best Paper Award of ETS’14 will be presented at ETS’15.


ETS’14 seeks original, unpublished contributions of the following types:

Detailed submission instructions, including selection criteria and publication policies, for the various types of contributions are posted [here]. The ETS’14 organizing committee strongly encourages the organization of fringe meetings and workshops.

Key Dates

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